1.0Sidenstein Medienhttps://www.sidenstein-medien.com/en/mathiashttps://www.sidenstein-medien.com/en/author/mathias/WEISS ShockEvent - Sidenstein Medienrich600338<blockquote class="wp-embedded-content" data-secret="7Ghud9K3oK"><a href="https://www.sidenstein-medien.com/en/portfolio/weiss-shockevent/">WEISS ShockEvent</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://www.sidenstein-medien.com/en/portfolio/weiss-shockevent/embed/#?secret=7Ghud9K3oK" width="600" height="338" title="“WEISS ShockEvent” — Sidenstein Medien" data-secret="7Ghud9K3oK" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script>
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https://www.sidenstein-medien.com/wp-content/uploads/2022/07/WeissUT_ShockEvent_Startbild_01.png1024576Environmental conditions have a major influence on the reliability of electronic components. In order to detect weak points, test specimens are subjected to extremely rapid temperature changes. To visualize this process, we have created an impressive view inside the device.